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【南强学术讲座】Graphene devices - from macroscopic to atomic scales and recent developments in the probing of material properties using advanced atomic force microscopy

发布日期:2017-09-15     浏览次数:次   
       南强学术讲座

题 目: Graphene devices - from macroscopic to atomic scales and recent developments in the probing of material properties using advanced atomic force microscopy

讲座人: Dr. Colm Durkan

时 间: 2017年9月15日（周五） 10:00

地 点: 主楼220会议室


欢迎各位老师同学积极参加！


嘉宾简介：
Founder and head of the Scanning Probe Microscopy and Nanoelectronics group at the Nanoscience centre of the University of Cambridge；
Reader in Nanoscale Engineering；
Fellow of Girton College, Cambridge;
Editorial board members of Microscopy and Imaging and Scientific Reports

Colm’s research is focused on understanding the fundamentals of the link between form (size & shape) and function in Nanomaterials, with an emphasis on advanced modes of microscopy and surface analysis, as applied to both highly-applied everyday problems as well as working on the underpinning science.


CV: https://durkanlab.org/colm-durkan  


厦门大学萨本栋微米纳米科学技术研究院
2017年9月13日

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